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D Eastwick

Conference paper (3)

3 records found

1

Impact of spot defects on fault modeling and tests in dual-port memories

Conference paper (2001) - S. Hamdioui (author) , AJ van de Goor (author) , D Eastwick (author) , M Rodgers (author)

Detecting unique faults in multi-port SRAMs

Conference paper (2001) - S. Hamdioui (author) , AJ van de Goor (author) , D Eastwick (author) , M Rodgers (author)

Realistic fault models and test procedure for multi-port SRAMs

Conference paper (2001) - S. Hamdioui (author) , AJ van de Goor (author) , D Eastwick (author) , M Rodgers (author)