Impact of stresses on the fault coverage of memory tests
Conference Paper
(2005)
Author(s)
S Hamdioui (TU Delft - Computer Engineering)
Z Al-Ars (TU Delft - Computer Engineering)
AJ van de Goor (TU Delft - Computer Engineering)
R Wadsworth (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:a6e03eac-08b9-464d-b052-d505f048080c
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Publication Year
2005
Research Group
Computer Engineering
Pages (from-to)
103-108
ISBN (print)
0-7695-2313-7
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