Characterization of a novel mask imaging algorithm based on the Extended Nijboer-Zernike (ENZ) formalism.
Poster
(2008)
Author(s)
S van Haver (TU Delft - ImPhys/Optics)
O.T.A. Janssen (TU Delft - ImPhys/Optics)
AJEM Janssen (External organisation)
J.J.M. Braat (TU Delft - ImPhys/Optics)
Silvania Pereira (TU Delft - ImPhys/Optics)
P Evanschitzky (External organisation)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:742c500f-f369-44c1-a596-ceb610b521d1
More Info
expand_more
expand_more
Publication Year
2008
Research Group
ImPhys/Optics
No files available
Metadata only record. There are no files for this record.