The effectiveness of Scan test and its new variants
Conference Paper
(2004)
Author(s)
AJ van de Goor (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
Zaid Al-Ars (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:7aa4f74d-d857-480b-a435-9f023d3a3ca9
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Publication Year
2004
Research Group
Computer Engineering
Pages (from-to)
26-31
ISBN (print)
0-7695-2193-2
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