Through-wafer copper electroplating for RF silicon technology

Conference Paper (2002)
Author(s)

NT Nguyen (TU Delft - Electronic Components, Technology and Materials)

TK Ng (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

E Boellaard (TU Delft - Electronic Components, Technology and Materials)

NP Pham (TU Delft - Electronic Components, Technology and Materials)

G Craciun (TU Delft - Electronic Instrumentation)

Lina P.M. Sarro (TU Delft - Electronic Components, Technology and Materials)

JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

Research Group
Electronic Components, Technology and Materials
More Info
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Publication Year
2002
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
255-258

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