Mechanical manipulation and exfoliation of boron nitride flakes by micro-plowing with an AFM tip

Journal article (2015)

Authors

J.O. Island QN/Mol. Electronics & Devices
G.A. Steele QN/Quantum Transport , QN/Mol. Electronics & Devices
H.S.J. van der Zant QN/Mol. Electronics & Devices
A Castellanos-Gomez External organisation
Research Group
QN/Mol. Electronics & Devices
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Published Date

2015

Language

Undefined/Unknown

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Research Group

QN/Mol. Electronics & Devices

Abstract

We demonstrate a simple method to manipulate and exfoliate thick hexagonal boron nitride (h-BN) flakes using an atomic force microscope (AFM) cantilever and tip mounted to a micromanipulator stage. Thick flakes of tens to hundreds of nanometers can be thinned down to large area, few-layer and monolayer flakes. We characterize the resulting thinned-down flakes using AFM and Raman spectroscopy. This technique is extendable to other two dimensional, van der Waals materials