BTI Impacts on logical gates in nano-scale CMOS technology
Conference Paper
(2012)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
H Kukner (External organisation)
F Catthoor (External organisation)
P Raghavan (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:89010473-b76a-4903-a092-844a029f80c2
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
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