The influence of mechanical stresses on the characteristics of bipolar transistors
Conference Paper
(2000)
Author(s)
F Jun (External organisation)
S Mijalkovic (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
WJ Eysenga (TU Delft - Electronic Components, Technology and Materials)
Henk van van Zeijl (TU Delft - Electronic Components, Technology and Materials)
W Crans (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:89197bd0-f8c1-4708-bfe9-a15babefa853
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Publication Year
2000
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
79-85
ISBN (print)
90-73461-24-3
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