23.2 A 40 A Shunt-Based Current Sensor with ±0.2% Gain Error from -40°C to 125°C and Self-Calibration

Conference Paper (2023)
Author(s)

Zhong Tang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Nandor G. Toth (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Roger Zamparette (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Tomohiro Nezuka (MIRISE Technologies)

Yoshikazu Furuta (MIRISE Technologies)

Kofi A.A. Makinwa (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/ISSCC42615.2023.10067304 Final published version
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Publication Year
2023
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
348-350
ISBN (electronic)
9781665428002
Event
2023 IEEE International Solid-State Circuits Conference, ISSCC 2023 (2023-02-19 - 2023-02-23), Virtual, Online, United States
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Abstract

Low-cost metal (e.g., PCB trace) shunts can be used to make accurate current sensors (< 1 % gain error) [1-3]. However, their reported maximum operating temperature (85 circC) is not high enough for automotive applications, and at higher temperatures, shunt resistance may exhibit increased drift, especially at high current levels. This paper presents a metal-shunt-based current sensor with a wide temperature range and a stable on-chip reference current (I textREF) source for shunt self-calibration. By employing a continuous-time (CT) front-end, it achieves an input noise density of 14textnV/sqrttextHz while consuming only 280mu A, making it > 10times more energy efficient than prior art [1], [2], with comparable gain error (pm0.2%) over a wider current (pm 40A) and temperature (-40 circC to 125 circC) range.

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