The state-of-art future trends in testing embedded memories
Conference Paper
(2004)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
G. N. Gaydadjiev (TU Delft - Computer Engineering)
AJ van de Goor (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:99078ef7-5620-4072-bcae-89315f36c8e4
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Publication Year
2004
Research Group
Computer Engineering
Pages (from-to)
54-59
ISBN (print)
0-7695-2193-2
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