Effect of delamination of IC/compound interface on passivation cracking
Conference Paper
(2003)
Author(s)
RBR van Silfhout (External organisation)
JD Roustant (External organisation)
WD van Driel (External organisation)
Yuhang Li (External organisation)
GQ Zhang (External organisation)
D Yang (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
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https://resolver.tudelft.nl/uuid:995cceab-5dde-4d27-a1e1-2d4ddc62debb
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Publication Year
2003
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
353-358
ISBN (print)
0-7803-7054-6
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