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JR
JD Roustant
Academic Work (1)
Conference paper (1)
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Effect of delamination of IC/compound interface on passivation cracking
Conference paper (2003) -
RBR van Silfhout (author)
,
JD Roustant (author)
,
WD van Driel (author)
,
Yaocheng Li (author)
,
GQ Zhang (author)
,
D Yang (author)