The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies
Journal Article
(2012)
Author(s)
J. Melskens (TU Delft - Photovoltaic Materials and Devices)
AHM Smets (TU Delft - Photovoltaic Materials and Devices)
Stephan W.H. Eijt (TU Delft - RST/Fundamental Aspects of Materials and Energy)
H. Schut (TU Delft - RST/Neutron and Positron Methods in Materials)
E. Bruck (TU Delft - RST/Fundamental Aspects of Materials and Energy)
Miro Zeman (TU Delft - Photovoltaic Materials and Devices)
Research Group
Photovoltaic Materials and Devices
DOI related publication
https://doi.org/10.1016/j.jnoncrysol.2012.01.037
To reference this document use:
https://resolver.tudelft.nl/uuid:a068a04c-56b4-4c7c-8668-d68ed961441b
More Info
expand_more
expand_more
Publication Year
2012
Language
English
Research Group
Photovoltaic Materials and Devices
Issue number
17
Volume number
358
Pages (from-to)
2015-2018
No files available
Metadata only record. There are no files for this record.