1.9 nm Wide Ultra-High Aspect-Ratio Bulk-Si FinFETs

Conference paper (2009)

Authors

V. Jovanovic Electronic Components, Technology and Materials - EEMCS
M Poljak External organisation
T Suligoj External organisation
Y Civale Electronic Components, Technology and Materials - EEMCS
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2009

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials