Testing for Parasitic Memory Effect in SRAMs
Conference Paper
(2011)
Author(s)
I.S. Irobi (TU Delft - Computer Engineering)
Zaid Al-Ars (TU Delft - Computer Engineering)
S. Hamdioui (TU Delft - Computer Engineering)
C Thibeault (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/ATS.2011.66
To reference this document use:
https://resolver.tudelft.nl/uuid:ac3ba017-d18a-42e3-90f6-be805d309bbf
More Info
expand_more
expand_more
Publication Year
2011
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
ISBN (print)
978-0-7695-4583-7
No files available
Metadata only record. There are no files for this record.