Characterisation of defects in industrial silicon carbide (6H-SiC) by helium desorption techniques

Report (2001)

Authors

E Oliviero External organisation
KT Westerduin Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
Research Group
Old - Section Defects in Materials
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Published Date

2001

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials