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EO
E Oliviero
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Authored
4 records found
Characterisation of defects in industrial silicon carbide (6H-SiC) by helium desorption techniques
Report -
E Oliviero
,
KT Westerduin
,
A van Veen
Helium implantation defects in SiC: a thermal helium desorption spectrometry investigation
Journal article -
E Oliviero
,
MF Beaufort
,
JF Barbot
,
A van Veen
,
AV Fedorov
On the effects of implantation temperature in helium implanted silicon
Journal article -
E Oliviero
,
ML David
,
MF Beaufort
,
JF Barbot
,
A van Veen
Helium implantation in silicon: the effects of implantation temperature
Journal article -
E Oliviero
,
ML David
,
AV Fedorov
,
A van Veen
,
MF Beaufort
,
JF Barbot