Prediction of delamination related ic & packaging reliability problems
Journal Article
(2005)
Author(s)
Willem D. van Driel (TU Delft - Dynamics of Micro and Nano Systems)
MAJ van Gils (External organisation)
RBR van Silfhout (External organisation)
Guo-Qi Zhang (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
DOI related publication
https://doi.org/doi:10.1016/j.microrel.2005.07.065
To reference this document use:
https://resolver.tudelft.nl/uuid:cdd6e4f7-eec5-4678-8c89-3fb2e6f3df81
More Info
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Publication Year
2005
Research Group
Dynamics of Micro and Nano Systems
Issue number
9-11
Volume number
45
Pages (from-to)
1633-1638
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