A CMOS Imager With Column-Level ADC Using Dynamic column Fixed-pattern Noise Reduction (U-SP-2-I-ICT)
Journal Article
(2006)
Author(s)
MF Snoeij (TU Delft - Electronic Instrumentation)
A.J.P.A.M. Theuwissen (TU Delft - Electronic Instrumentation)
Kofi AA Makinwa (TU Delft - Electronic Instrumentation)
JH Huijsing (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:d045805d-381b-4126-8194-64525a15823c
More Info
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Publication Year
2006
Research Group
Electronic Instrumentation
Issue number
12
Volume number
41
Pages (from-to)
3007-3015
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