Interconnect test for 3D stacked memory-on-logic
Conference Paper
(2014)
Author(s)
Mottaqiallah Taouil (TU Delft - Computer Engineering)
M Masadeh (External organisation)
S. Hamdioui (TU Delft - Computer Engineering)
EJ Marinissen (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.7873/DATE.2014.139
To reference this document use:
https://resolver.tudelft.nl/uuid:d11d1674-66bd-4a05-b571-70da97c35687
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Publication Year
2014
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
ISBN (print)
978-3-9815370-2-4
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