Evaluation of HBT device linearity using advanced measurement techniques
Conference Paper
(2013)
Author(s)
K Buisman (TU Delft - Electronics)
L.C.N. de Vreede (TU Delft - Electronics)
M Marchetti (TU Delft - Electronics)
MP Heijden (External organisation)
PJ Zampardi (External organisation)
Research Group
Electronics
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https://resolver.tudelft.nl/uuid:d4a9b0c1-b184-4c20-ab23-f4072fa2bc1d
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Publication Year
2013
Language
English
Research Group
Electronics
Bibliographical Note
Harvest@en
Pages (from-to)
259-262
ISBN (print)
978-2-87487-031-6
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