High-efficiency silicon photodiode detector for sub-keV electron microscopy

Sakic, A.; van Veen, G; Kooijman, K; Vogelsang, P.; Scholtes, T.L.M.; de Boer, W.B.; Derakhshandeh Kheljani, J.; Wien, W.H.A.; Milosavljevic, S.; Nanver, L.K.

High-efficiency silicon photodiode detector for sub-keV electron microscopy

Journal article (2012)

Authors

A. Sakic Electronic Components, Technology and Materials -

G van Veen External organisation

K Kooijman External organisation

P. Vogelsang External organisation

T.L.M. Scholtes Electronic Components, Technology and Materials -

W.B. de Boer Old - EWI Sect. ECTM

J. Derakhshandeh Kheljani Electronic Components, Technology and Materials -

W.H.A. Wien Electronic Components, Technology and Materials -

S. Milosavljevic Electronic Components, Technology and Materials -

L.K. Nanver Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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Published Date

2012

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials