Analysis and calibration of process variations for an array of temperature sensors

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Analysis and calibration of process variations for an array of temperature sensors

Conference Paper (2017)

Author(s)

S. Xie (TU Delft - Electrical Engineering, Mathematics and Computer Science)

A. Abarca (TU Delft - Electrical Engineering, Mathematics and Computer Science)

J. Markenhof (External organisation)

Xiaoliang Ge (TU Delft - Electrical Engineering, Mathematics and Computer Science)

A. Theuwissen (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group

Electronic Instrumentation

Calibration CMOS image sensor Sensor array BJT based temperature sensor

DOI related publication

https://doi.org/10.1109/ICSENS.2017.8233959 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:dab136bf-867c-4608-86d0-3be7cef61e17

More Info

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Publication Year

2017

Language

English

Research Group

Electronic Instrumentation

Pages (from-to)

1-3

ISBN (print)

978-1-5090-1013-4

ISBN (electronic)

978-1-5090-1012-7

Event

IEEE SENSORS 2017 (2017-10-29 - 2017-11-01), Glasgow, United Kingdom

Downloads counter

170

Abstract

This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).