Analysis and calibration of process variations for an array of temperature sensors

None, None; None, None; None, None; None, None; None, None

Analysis and calibration of process variations for an array of temperature sensors

Conference Paper (2017)

Author(s)

S. Xie (TU Delft - Electronic Instrumentation)

A. Abarca Prouza (TU Delft - Electronic Instrumentation)

J. Markenhof (External organisation)

Xiaoliang Ge (TU Delft - Electronic Instrumentation)

Albert J.P. Theuwissen (TU Delft - Electronic Instrumentation)

Research Group

Electronic Instrumentation

DOI related publication

https://doi.org/10.1109/ICSENS.2017.8233959

Calibration CMOS image sensor Sensor array BJT based temperature sensor

To reference this document use:

https://resolver.tudelft.nl/uuid:dab136bf-867c-4608-86d0-3be7cef61e17

More Info

expand_more

Publication Year

2017

Language

English

Research Group

Electronic Instrumentation

Pages (from-to)

1-3

ISBN (print)

978-1-5090-1013-4

ISBN (electronic)

978-1-5090-1012-7

Abstract

This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).

No files available

Metadata only record. There are no files for this record.