Characterization of low-loss hydrogenated amorphous silicon films for superconducting resonators
B.T. Buijtendorp (TU Delft - Tera-Hertz Sensing)
J. Bueno (SRON–Netherlands Institute for Space Research)
D.J. Thoen (TU Delft - Tera-Hertz Sensing)
V. Murugesan P.M. Sberna (SRON–Netherlands Institute for Space Research)
Jochem J. A. Baselmans (TU Delft - Tera-Hertz Sensing)
S. Vollebregt (TU Delft - Sanitary Engineering)
Akira Endo (TU Delft - Tera-Hertz Sensing)
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Abstract
Superconducting resonators used in millimeter-submillimeter astronomy would greatly benefit from deposited dielectrics with a small dielectric loss. We deposited hydrogenated amorphous silicon films using plasma-enhanced chemical vapor deposition, at substrate temperatures of 100°C, 250°C and 350°C. The measured void volume fraction, hydrogen content, microstructure parameter, and bond-angle disorder are negatively correlated with the substrate temperature. All three films have a loss tangent below 10−5 for a resonator energy of 105 photons, at 120 mK and 4–7 GHz. This makes these films promising for microwave kinetic inductance detectors and on-chip millimeter-submilimeter filters.