Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS Compatibility

Journal Article (2014)
Author(s)

LK Nanver (TU Delft - Electronic Components, Technology and Materials)

L. Qi (TU Delft - Electronic Components, Technology and Materials)

V. Mohammadi (TU Delft - Electronic Components, Technology and Materials)

C Mok Kai Rine (TU Delft - Electronic Components, Technology and Materials)

WB de Boer (TU Delft - Old - EWI Sect. ECTM)

N Golshani (TU Delft - Electronic Components, Technology and Materials)

A. Sammak (TU Delft - Electronic Components, Technology and Materials)

T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)

A Gottwald (External organisation)

U Kroth (External organisation)

F Scholze (External organisation)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/JSTQE.2014.2319582
More Info
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Publication Year
2014
Language
English
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Harvest@en
Issue number
6
Volume number
20
Pages (from-to)
1-11

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