Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS Compatibility

Journal Article (2014)
Authors

LK Nanver (TU Delft - Electronic Components, Technology and Materials)

L Qi (TU Delft - Electronic Components, Technology and Materials)

V Mohammadi (TU Delft - Electronic Components, Technology and Materials)

C Mok Kai Rine (TU Delft - Electronic Components, Technology and Materials)

W.B. de Boer (Old - EWI Sect. ECTM)

N Golshani (TU Delft - Electronic Components, Technology and Materials)

Amir Sammak (TU Delft - Electronic Components, Technology and Materials)

T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)

Lukas M. Gottwald (External organisation)

U Kroth (External organisation)

F Scholze (External organisation)

Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://doi.org/10.1109/JSTQE.2014.2319582
More Info
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Publication Year
2014
Language
English
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Harvest@en
Issue number
6
Volume number
20
Pages (from-to)
1-11
DOI:
https://doi.org/10.1109/JSTQE.2014.2319582

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