Simplified Procedures for COTS TID Testing

A Comparison between <sup>90</sup>Sr and <sup>60</sup>Co

Conference paper (2018)

Authors

A. Menicucci Space Systems Egineering
F. Malatesta Space Systems Egineering , Cobham Gaisler
Francesco Di Capua Università degli Studi di Napoli Federico II
Luigi Campajola Università degli Studi di Napoli Federico II
Pierluigi Casolaro Università degli Studi di Napoli Federico II
Gianluca Furano European Space Agency (ESA)
S. Di Mascio Space Systems Egineering
Marco Ottavi University of Rome Tor Vergata
Research Group
Space Systems Egineering
Copyright: © 2018 A. Menicucci, F. Malatesta, Francesco Di Capua, Luigi Campajola, Pierluigi Casolaro, Gianluca Furano, S. Di Mascio, Marco Ottavi
DOI: https://doi.org/10.1109/NSREC.2018.8584279
Component Cobalt Total dose
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Published Date

19-12-2018

Language

English

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Research Group

Space Systems Egineering

Abstract

The tolerance to the cumulative effects of ionizing radiation is one of the most important parameters to keep into account when selecting an EEE component for space applications. TID sensitivity is normally investigated measuring changes induced by gamma rays from 60Co sources to nominal parameters of a component or to its expected functional behavior. In this work we propose an on-chip 90Sr/90Y electron source as an alternative methodology for TID tests.60Co and 90Sr/90Y TID test setups for a complex SoC are compared in terms of complexity and of experimental results, investigating the use of a 90Sr/90Y as well as the established 60Co. We show that 90Sr allows a simpler test setup, manages to reproduce specific modes of failure obtained with 60Co and causes failures at comparable total doses. This makes 90Sr an interesting alternative to 60Co qualification and the use of untested components, to be further investigated especially for complex COTS SoCs.