Mechanical behaviour during thermal cycling of AIVPd line patterns
Journal Article
(1997)
Author(s)
JP Lokker (TU Delft - QN/Fysics of NanoElectronics)
AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)
H Schellevis (TU Delft - Electronic Components, Technology and Materials)
G.C.A.M. Janssen (TU Delft - OLD Metals Processing, Microstructures and Properties)
S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:fffb42e1-854f-4fc3-90dd-cee6aba54da8
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Publication Year
1997
Research Group
QN/Fysics of NanoElectronics
Volume number
33
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