Print Email Facebook Twitter Board level vibration test method of components for automotive electronics Title Board level vibration test method of components for automotive electronics: State-of-the-art approaches and challenges Author Thukral, V. (TU Delft Electronic Components, Technology and Materials; NXP Semiconductors Germany) van Soestbergen, M. (NXP Semiconductors) Zaal, J.J.M. (NXP Semiconductors) Roucou, R. (NXP Semiconductors) Rongen, R.T.H. (NXP Semiconductors) van Driel, W.D. (TU Delft Electronic Components, Technology and Materials) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) Date 2022 Abstract Board level vibration testing is intended to assess prediction of the reliability of solder joint interconnects that are formed between electronic components and printed circuit boards (PCB). Frailties in the stress test experiment might lead to false board level reliability (BLR) evaluations. Therefore, it is essential to have a well-characterized board level vibration test method. Currently, there is no industrial test standard that prescribes board level vibration test method for electronic components at the PCB level. This paper examines the vibration test standards that are currently available in the industry and their applicability at the solder joint interconnect level. Next to that, it surveys the state-of-the-art board level vibration test setups and their impact on PCB dynamic loading and reliability at solder joint-PCB interface. It collates research on major building blocks of a board level vibration test method that includes vibration measurement techniques, PCB assemblies under test, board mounting schemes, operating environments, fault detection systems, and vibration test stress conditions that are currently used in the domain of solder joint level vibration testing. The findings from this paper are expected to reveal pitfalls and challenges while setting up board level vibration test experiments for electronic components. In addition, this paper attempts to identify research efforts that are required to make board level vibration testing a more credible means for assessing solder joint reliability. Outcomes from this study can further be used to guide future board level vibration specifications for electronic components. Subject Ball grid array packagesBoard level reliabilityBoard level vibration testJEDEC standardsPCB dynamic responseWafer level chip scale packages To reference this document use: http://resolver.tudelft.nl/uuid:a9b66489-69b5-4689-8a24-bd21ca9ed105 DOI https://doi.org/10.1016/j.microrel.2022.114830 Embargo date 2023-04-25 ISSN 0026-2714 Source Microelectronics Reliability, 139 Bibliographical note Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type review Rights © 2022 V. Thukral, M. van Soestbergen, J.J.M. Zaal, R. Roucou, R.T.H. Rongen, W.D. van Driel, Kouchi Zhang Files PDF 1_s2.0_S0026271422003547_main.pdf 6.58 MB Close viewer /islandora/object/uuid:a9b66489-69b5-4689-8a24-bd21ca9ed105/datastream/OBJ/view