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Searched for: subject%3A%22Atomic%255C%252Bforce%255C%252Bmicroscopy%22
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Atomic radical abatement of organic impurities from electron beam deposited metallic structures
Influence of hydrogen silsesquioxane resist exposure temperature on ultrahigh resolution electron beam lithography
Electrical transport in monolayers of phthalocyanine molecular wires and AFM imaging of a single wire bridging two electrodes