Searched for: subject%3A%22Chip%255C+scale%255C+package%22
(1 - 4 of 4)
document
Thukral, V. (author), van Soestbergen, M. (author), Zaal, J.J.M. (author), Roucou, R. (author), Rongen, R.T.H. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Board level vibration testing is intended to assess prediction of the reliability of solder joint interconnects that are formed between electronic components and printed circuit boards (PCB). Frailties in the stress test experiment might lead to false board level reliability (BLR) evaluations. Therefore, it is essential to have a well...
review 2022
document
Yuan, Cadmus (author), Fan, Xuejun (author), Zhang, Kouchi (author)
Solder joint fatigue is one of the critical failure modes in ball-grid array packaging. Because the reliability test is time-consuming and geometrical/material nonlinearities are required for the physics-driven model, the AI-assisted simulation framework is developed to establish the risk estimation capability against the design and process...
journal article 2021
document
Qian, Cheng (author), Fan, Jiajie (author), Fang, Jiayi (author), Yu, Chaohua (author), Ren, Y. (author), Fan, Xuejun (author), Zhang, Kouchi (author)
By solving the problem of very long test time on reliability qualification for Light-emitting Diode (LED) products, the accelerated degradation test with a thermal overstress at a proper range is regarded as a promising and effective approach. For a comprehensive survey of the application of step-stress accelerated degradation test (SSADT) in...
journal article 2017
document
Tang, H. (author), Ye, H. (author), Wong, K.Y. (author), Leung, Stanley Y.Y. (author), Fan, Jiajie (author), Chen, Xianping (author), Fan, Xuejun (author), Zhang, Kouchi (author)
The objective of this study is to quantitatively evaluate the impacts of LED components on the overdriving reliability of high power white LED chip scale packages (CSPs). The reliability tests under room temperature are conducted over 1000 h in this study on CSP LEDs with overdriving currents. A novel method is proposed to investigate the...
journal article 2017
Searched for: subject%3A%22Chip%255C+scale%255C+package%22
(1 - 4 of 4)