Searched for: subject%3A%22aberrations%22
(1 - 2 of 2)
document
Krielaart, M.A.R. (author)
We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum...
doctoral thesis 2021
document
Abedzadeh, Navid (author), Krielaart, M.A.R. (author), Kim, Chung Soo (author), Simonaitis, John (author), Hobbs, Richard (author), Kruit, P. (author), Berggren, Karl K. (author)
The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic electron mirror system under a sample in a conventional scanning electron microscope (SEM), we present a...
journal article 2021