Emerging, non-volatile memories are promising solutions to contemporary computing problems. These include In-Memory Computing, Neuromorphic Computing, and Machine Learning. We believe that these are not the only possible applications of non-volatile emerging memory devices and that these can be used effectively for tackling several challenges of the ”conventional” computer architecture. For instance, address decoders are an integral part of random access memories. They are typically implemented using fast logic optimised for low latency. They are, however, difficult to test, while their repair is considered to be impossible. In this thesis we research the possibility of a highly scalable and testable address decoder solution, based on Content-Addressable Memories build with ferroelectric transistors (FeFET). This solution can offer numerous advantages including transistor count close to state of the art designs, while outperforming them in terms of latency. In addition, a key advantage could emerge during the testing of this decoder; due to its regular 2D structure, it’s testability is comparable to that of conventional memory arrays. Moreover, it can enable higher production yields, considering that adding a few spare rows will enable end-of-production repair, in the presence of manufacturing defects. By additionally increasing the number of address bits stored in a single FeFET CAM cell, further potential area reductions of 30% - compared to the traditional dynamic NAND decoders - can be achieved.