J Braun | TU Delft Repository

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J Braun

Conference paper (3)

3 records found

1

Optimizing stresses for testing DRAM cell defects using electrical simulations

Conference paper (2003) - Zaid Al-Ars (author) , AJ van de Goor (author) , J Braun (author) , D Richter (author)

Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs

Conference paper (2001) - Z Al-Ars (author) , AJ van de Goor (author) , J Braun (author) , D Richter (author)

A memory specific notation for fault modeling

Conference paper (2001) - Z Al-Ars (author) , AJ van de Goor (author) , J Braun (author) , D Richter (author)