F. Berwald | TU Delft Repository

FB

F. Berwald

Book chapter (1)

Conference paper (1)

Journal article (2)

4 records found

1

Compensation of High-Frequency Disturbances in Scanning Microscopes

Book chapter (2012) - P. Kruit (author), V.F. van Ravesteijn (author), B. Rieger (author), F. Berwald (author), J.H.M. van der Linden (author)

Electron-Beam-Induced of 3.5 nm Half-Pitch Dense Patterns on Bulk Si

Journal article (2011) - J.C. van Oven (author), F. Berwald (author), K.K. Berggren (author), P. Kruit (author), C.W. Hagen (author)

Positioning Pd catalyst particles for carbon nanotube growth using charge patterns created with a scanning electron microscope

Journal article (2009) - A.C. Zonnevylle (author), P. Kruit (author), C.W. Hagen (author), F. Berwald (author), A. Schmidt-Ott (author)

What we learned from special purpose computers.

Conference paper (2001) - AF Bakker (author), F. Berwald (author)