XW

Xinyue Wang

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13 records found

Conference paper (2026) - Xinyue Wang, Wenting Liu, Letao Bian, Zhoudong Yang, G.Q. Zhang, Jing Zhang, Kim S. Siow, Pan Liu
Cu-Ag composite sintered pastes are promising die-attach materials for wide bandgap power modules, yet their electrothermal performance is governed by 3D phase connectivity and interfacial morphology. In this work, a workflow for better predicting the thermal and electrical conductivity was presented, using 2D SEM processing, 3D reconstruction with a self-learning optimized QSGS algorithm, and electrothermal finite element simulations in COMSOL Multiphysics. A Hashin Shtrikman composition baseline, together with closed-form structure-corrected equations, was further introduced for better prediction accuracy, which enables rapid screening and microstructure-informed design of composite sintering materials for die-attach. ...
Review (2025) - Xinyue Wang, Zhoudong Yang, Letao Bian, Wenting Liu, Guoqi Zhang, Jing Zhang, Chuantong Chen, Pan Liu
While silver-based sintered materials are limited by cost and electromigration, and copper faces challenges with oxidation at high temperatures, Cu-based composite sintering materials offer promising alternative solutions. This review examines recent advances in Cu-based composite sintered materials for die-attach in power electronics packaging, focusing on their mechanical, thermal, electrical properties, and reliability. This review systematically categorizes such compounding strategies, including direct mixing, core-shell structures, and alloying, analyzing the impact on composite properties. Furthermore, the reliability of Cu-based composite sintered joints is evaluated, addressing high-temperature storage, thermal cycling, corrosion, and electrochemical migration. Challenges such as oxidation resistance, process optimization, and cost-effectiveness are discussed, together with future research directions. This work aims to support researchers in advancing Cu-based composite sintering materials research and development, broadening material options for high-temperature power electronics packaging applications. ...
Journal article (2025) - Wenting Liu, Xinyue Wang, Jing Zhang, Guoqi Zhang, Chuantong Chen, Pan Liu
Sintered materials have been widely applied, as an alternative to soldering, for power electronics packaging. One key issue for such die-attach material is to characterize the actual porosity, which is difficult to obtain through SEM cross-section analysis. Therefore, in this work, the optimized Quartet Structure Generation Set (QSGS) algorithm was applied to sintered copper joints under various porosity levels to reconstruct 3D porous structures based on 2D SEM images. Firstly, copper joints with varying porosities were fabricated under different sintering conditions. Reconstructed 3D porous copper models were then generated through the QSGS algorithm to match experimental observations, including porosity and pore size. Finite element analysis (FEA) simulations were further conducted to explore the effects of pores on thermal and electrical performance. This work provides a method for accurately predicting the thermoelectric properties of sintered copper joints and insights for optimizing copper sintering in power electronics applications. ...
Journal article (2025) - Zhoudong Yang, Jing Tian, Xinyue Wang, Junwei Chen, Yuanhui Zuo, Rongjun Zhang, Hongyu Tang, Xuejun Fan, Guoqi Zhang, Jiajie Fan
This Letter presents a combined analytical and experimental method to effectively decouple the radial and tangential residual stress fields induced by Berkovich nanoindentation in single-crystalline 4H-SiC using micro-Raman spectroscopy. By integrating the Raman stress characterization model with Yoffe’s expanding cavity model, precise extraction of individual residual stress components around the indentation region is realized. Through the vertical backscattering micro-Raman mapping of the E2 phonon mode, we systematically investigate the residual stress distribution near the indentation. The results highlight significant anisotropy in nanoindentation-induced stress fields, strongly dependent on the crystal orientation of 4H-SiC, predominantly featuring radial tensile stress gradients. This comprehensive theoretical–experimental approach offers a robust optical framework for residual stress characterization in 4H-SiC and provides foundational insights for extending Raman spectroscopy-based stress characterization to other crystalline materials and related device structures. ...
Conference paper (2025) - Zhoudong Yang, Xinyue Wang, Yanyan Zhang, Yuanhui Zuo, Hongyu Tang, Xuejun Fan, Guoqi Zhang, Jiajie Fan
4H-SiC is widely employed in power electronic devices operating under high frequencies, voltages, and temperatures due to its exceptional physical properties. However, its inherent high hardness and elastic modulus induce inevitable residual stress during device fabrication. Raman spectroscopy, which leverages lattice dynamics, offers an effective, non-destructive, rapid, and contactless method for measuring these stresses. Nevertheless, its accuracy critically depends on precisely determining the Raman phonon deformation potential constant. This work investigates mechanically induced Raman shifts in 4H-SiC via first-principles calculations and in-situ Raman spectroscopy under hydrostatic and non-hydrostatic stress conditions. The E2(TO) and A1(LO) phonon modes exhibit sensitivity to hydrostatic stress, whereas A1(LO) remains largely unaffected under shear, reflecting directional vibrational differences. Theoretical predictions and experimental measurements agree well within 16% error, highlighting the effectiveness of Raman-based stress detection for 4H-SiC. This integrated theoretical–experimental approach provides a robust framework for stress and strain analysis, facilitating the design and fabrication of next-generation 4H-SiC electronic devices. ...
Journal article (2025) - Zhoudong Yang, Yuanhui Zuo, Xinyue Wang, Hong Zhou, Hongyu Tang, Changran Zheng, Rongjun Zhang, Guoqi Zhang, Jiajie Fan, More authors...
High-energy Al ion implantation is an indispensable technique for achieving precise doping in fabricating 4H‑SiC devices. However, it inevitably introduces interfacial damage and residual stress that can compromise subsequent manufacturing processes and device reliability. Conventional destructive characterization techniques cannot provide real-time, in‑situ, nondestructive monitoring under process conditions, creating a major bottleneck in quality control. Here, we establish a predictive modeling framework that integrates multiscale simulations with advanced, non‑destructive micro‑Raman spectroscopy to systematically investigate the evolution of high-energy Al ion implantation–induced interface defects and residual stress in 4H-SiC. Simulation results reveal a linear relationship between the implantation dose and the formation of vacancies and interstitial defects, while the stress accumulation tends to saturate at higher doses due to a dynamic equilibrium among defect interactions. Complementary micro‐Raman spectroscopy corroborates the simulations, showing that the damaged interface layer deepens from approximately 300 nm at a dose of 1014 ions cm−2 to nearly 500 nm at 1016 ions cm−2, consistent with Monte Carlo predictions. Furthermore, the molecular dynamics simulations capture a trend of the implantation stress evolution with strong concurrence with the Raman-measured residual stress. This combined computational–experimental approach elucidates the fundamental mechanisms governing defect formation and residual stress in ion‑implanted 4H‑SiC, establishes implantation dose as the pivotal role of 4H-SiC in defect density and residual stress, and underscores the utility of optical‑based characterization in real‑time, non‑invasive quality control for advanced manufacturing. ...
Journal article (2024) - Xinyue Wang, Haixue Chen, Zhoudong Yang, Wenting Liu, Zejun Zeng, Guoqi Zhang, Jing Zhang, Jiajie Fan, Pan Liu
With the increased deployment of power modules in demanding conditions, sintering materials, especially composite sintering materials, have raised growing interest due to their cost-effectiveness and suitability. Therefore, this study explores the viability of Cu–Ag composite sintering material, focusing on solvent influence through microstructure and mechanical behavior analysis. Micron-sized particle-based Cu–Ag composite pastes were designed and compared using eight solvents (four epoxy-free and four epoxy-added) based on fluidity and thermal stability. The sintered joints' performance, assessed through shear strength analysis, showed comparable values to pure silver sintering for both epoxy-free and epoxy-added samples. Optimized samples from each solvent system underwent reliability analysis, demonstrating that Cu–Ag joints with epoxy resin exhibited significantly higher shear strength after high-temperature storage and thermal cycling tests. Micromorphology and elemental composition analysis revealed differences in aging mechanisms, primarily attributed to variations in porosity due to oxide formation and pore filling by epoxy resin under different solvent systems. Further nanoindentation characterization of micromechanical properties, including hardness, modulus, and creep properties, during high-temperature aging, established constitutive models for insights into reliability evolution. In conclusion, the optimized epoxy-added Cu–Ag sintered joints proposed in this study demonstrated exceptional reliability and acceptable micromechanical properties, presenting a promising option for high-temperature power packaging. ...
Review (2024) - Zhoudong Yang, Xinyue Wang, Wei Chen, Hongyu Tang, Rongjun Zhang, Xuejun Fan, Guoqi Zhang, Jiajie Fan
In the rapidly evolving era of information and intelligence,microelectronic devices are pivotal across various fields, such as mobile devices, big data computing, electric vehicles, and aerospace. However, the electrical performance of these devices often suffers due to residual stress from microelectronic manufacturing. This issue is compounded by the additional thermal stress that accumulates during device operation. Therefore, it is essential to understand, characterize, and control this residual stress to ensure the reliability and efficiency of microelectronic devices. Raman spectroscopy emerges as an invaluable tool for nondestructive, fast, noncontact, and precise testing of micro-scale mechanics, significantly aiding in stress and strain analysis within microelectronic manufacturing. This article aims to provide a thorough overview of the theory and application beyond a mere compilation of recent advances. Theoretically, it critically evaluates existing models that describe the Raman-stress relation. Practically, it explores the application of Raman spectroscopy in researching residual stress in various components, including substrate materials, epitaxial films, and packaging. Through a detailed examination of current applications, it highlights the significance of Raman spectroscopy in understanding micro-scale mechanics. Finally, it offers both theoretical and practical insights into the future developments of Raman-stress detection technology. ...

Microstructure evolution, mechanical performance, and molecular dynamics simulation of diffusion behaviors

Journal article (2024) - Wenting Liu, Xinyue Wang, Jing Zhang, Guoqi Zhang, Pan Liu
With the advancement of power electronics, aluminum-clad copper thick bonding wires have garnered attentions due to superior electrical and thermal properties, making them well-suited for high-temperature and high-current applications. However, the impact remains unveiled of whether the growth of intermetallic compounds (IMCs) at the bonding interface presents critical challenges to the reliability of wedge wire bonds. Therefore, it is necessary to investigate the evolution behavior of Cu/Al IMCs in Al-clad copper wires. In this study, Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) were firstly employed to characterize the phase composition and growth behavior of Cu/Al intermetallic compounds (IMCs) at two distinct interfaces—the bonding interface and the core-shell interface—under various annealing conditions during high-temperature storage (HTS) tests, revealing a parabolic relationship between aging time and IMCs thickness. Subsequently, shear and pull tests of Al-clad copper bond wires were conducted to evaluate the bonding strength under different aging conditions, clarifying the correlation between various failure modes of the bonds and the evolution of IMCs at the bi-interfaces of this novel composite across different aging stages. Additionally, molecular dynamics (MD) simulations were employed to explore the diffusion behavior of Cu and Al atoms. It revealed that polycrystalline structures enhanced the mutual diffusion at the interface, with copper serving as the predominant element in the interdiffusion process. In conclusion, this study integrates experimental and numerical approaches to elucidate the growth mechanisms of Cu/Al intermetallic compounds and their effects on reliability, providing valuable guidance for optimizing the performance of composite bonding wires in high-temperature power device applications. ...
Journal article (2024) - Zhoudong Yang, Xinyue Wang, Yuanhui Zuo, Zhuorui Tang, Hongyu Tang, Rongjun Zhang, Xuejun Fan, Guoqi Zhang, Jiajie Fan, More Authors...
4H-SiC is widely used in power electronics owing to its superior physical properties. However, temperature-induced stresses compromise the reliability of 4H-SiC power devices in high-temperature applications, warranting precise, and nondestructive stress characterization responsive to temperature variations. Herein, a temperature-dependent predictive model is proposed for analyzing the Raman shift–stress in 4H-SiC. The 4H-SiC epitaxial samples prepared via chemical vapor deposition are characterized using in situ variable-temperature Raman spectroscopy, resulting in a temperature correction factor of approximately −0.021 cm−1 K−1, which is integrated into the conventional Raman shift–stress relationship to assess stress variations induced by temperature variations. The elastic modulus tensor of 4H-SiC at various temperatures determined using molecular dynamics simulations indicates a linear reduction in modulus with increasing temperature. This variable temperature modulus is incorporated into the Raman shift–stress relationship. Furthermore, a finite element method is used for model simplification to perform stress calculations in three axial directions. The experimental results confirm the consistency between calculated and experimental values with a 10% error range under the uniaxial stress condition. The study findings provide valuable insights into assessing stress evolution in 4H-SiC under temperature variations based on Raman spectroscopy, thereby advancing the application of spectroscopic techniques in material stress detection. ...
Conference paper (2023) - Xinyue Wang, Zhoudong Yang, Guoqi Zhang, Jing Zhang, Pan Liu
With the popularization of wide band-gap power modules in offshore wind power systems and water surface photovoltaic power stations, packaging materials face challenges of corrosion by salt, blended with high humidity. Copper-silver (Cu-Ag) composite sintered paste was proposed by researchers as a novel die-attach material for a lower cost and anti-electro migration ability. However, the potential difference between copper and silver forms galvanic corrosion in a high-humidity environment, resulting in accelerated failure combined with salt mist. To further promote the application of composite sintered materials, a copper-silver double-sphere galvanic corrosion model based on finite element simulation was proposed in this paper. The relationship between corrosion rate and time of different Cu-Ag particle size combinations under different sintering degrees was predicted by initial exchange current density. Through the electrochemical characterization of the sintered samples, the optimal combination of materials was further discussed. The accuracy of the model was also verified. The conclusions obtained from both the experiments and simulation work provide guidance for future anti-corrosion analysis, as well as the reliability improvement of novel composite sintered materials. ...
Journal article (2023) - Haixue Chen, Xinyue Wang, Zejun Zeng, Guoqi Zhang, Jing Zhang, Pan Liu
With the development of electronic technology towards high power, miniaturization, and system integration, power electronic packaging is facing increasing challenges, especially for die attachment. This research aims to explore silver-coated copper (Cu@Ag) paste with sufficient mechanical properties and high-temperature reliability, as an alternative solution for silver sintering with lower cost. Firstly, micro-Cu@Ag sintering pastes were investigated under four kinds of polyol-based solvent systems and two types of particle morphologies, which included sphere-type (SCu@Ag) and flake-type (FCu@Ag). Sintering performance and microstructural evolution were compared and analyzed. Notably, sintered joints employing the terpineol–polyethylene glycol solvent system and flake-type morphology displayed a denser microstructure in comparison to SCu@Ag joints. Its bonding strength reached 36.15 MPa, which was approximately 20% higher than SCu@Ag joints. Subsequently, the influence of key sintering process parameters on Cu@Ag joints was analyzed, including sintering temperature, pressure and time. Additionally, high-temperature aging and thermal cycling tests were conducted on the optimized Cu@Ag joints to assess their reliability. Finally, the micromechanical properties of Cu@Ag joints before and after high-temperature aging were further evaluated by nanoindentation including creep properties. The elastoplastic constitutive models of Cu@Ag sintered materials with different particle morphologies were constructed, providing valuable insights for reliability evaluation. The results indicated that FCu@Ag joints exhibited satisfactory creep resistance and high-temperature reliability. In conclusion, the FCu@Ag micro-paste based on the terpineol–polyethylene glycol solvent system proposed in this study demonstrated sufficient bonding strength, high reliability, and adequate mechanical properties as an attractive solution for high-temperature power electronics packaging. ...
Journal article (2023) - Xinyue Wang, Zhoudong Yang, Boya Wang, Wei Chen, Guoqi Zhang, Jing Zhang, Jiajie Fan, Pan Liu
Power modules applied in offshore applications are facing risks of corrosion failures on die-attach materials due to high humidity and H2S exposure. To investigate such corrosion behavior for sintered die-attach materials, we conducted a study with four groups of samples fabricated using copper and silver metal particles under different solvent systems. Such samples were firstly subjected to high-humidity-H2S conditions for 168 h to simulate the harsh offshore environment. After undergoing corrosion, the primary compounds formed were CuO/Cu2O and Ag2S through SEM, XRD, and XPS analysis. Notably, the incorporation of epoxy resin into sintered copper joints resulted in a remarkable reduction in corrosion and a substantial improvement in electrical conductivity after the reaction. In contrast, while the addition of epoxy did not evidently reduce corrosion in silver joints, it did lead to a significant increase in shear strength. Furthermore, to gain further insights into the effect of epoxy resin on corrosion behavior, electrochemical analysis, and molecular dynamics simulations were conducted. Finally, the mechanical reliability of the corroded copper and silver joints was evaluated through thermal shock tests. In summary, sintered copper joints exhibited better anti-corrosion behaviors than sintered silver under high humidity and H2S exposure, especially with the addition of epoxy resin. However, the corrosion products of sintered copper suffered from a sharp decrease in shear strength after thermal shock tests than sintered silver, which is probably due to the coefficient of thermal expansion mismatch. ...