Deep Learning (DL) has recently led to remark-able advancements, however, it faces severe computation related challenges. Existing Von-Neumann-based solutions are dealing with issues such as memory bandwidth limitations and energy inefficiency. Computation-In-Memory (CIM) has the potential to address this problem by integrating processing elements directly into the memory architecture, reducing data movement and enhancing the overall efficiency of the system. In this work, we propose CIM architecture using three distinct emerging technologies. Firstly, a CIM architecture utilizing Ferroelectric Field-Effect Transistors (FeFET) is shown and the resulting errors from the analog compute scheme are injected into the emerging algorithm of Hyperdimensional Computing. Subsequently, we explore Vertical Nanowire Field-Effect Transistors (VNWFETs) based CIM within a 3D computing architecture, demonstrating improved energy efficiency and reconfigurability for CIM. Additionally, we improve the accuracy of the Resistive Random Access Memories (RRAM) based CIM architecture using two mapping-based solutions. These three technologies exhibit non-volatile characteristics, and when integrated into the CIM architecture, they yield significant advantages, including enhanced energy efficiency, reliability, and accuracy in computing processes.

@en

The paper addresses some of the opportunities and challenges related to test and reliability of three major emerging computing paradigms; i.e., Quantum Computing, Computing engines based on Deep Neural Networks for AI, and Approximate Computing (AxC). We present a quantum accelerator showing that it can be done even without the presence of very good qubits. Then, we present Dependability for Artificial Intelligence (AI) oriented Hardware. Indeed, AI applications shown relevant resilience properties to faults, meaning that the testing strongly depends on the application behavior rather than on the hardware structure. We will cover AI hardware design issues due to manufacturing defects, aging faults, and soft errors. Finally, We present the use of AxC to reduce the cost of hardening a digital circuit without impacting its reliability. In other words how to go beyond usual modular redundancy scheme.@en