Dependence of single-crystalline Si TFT characteristics on the channel position inside a location-controlled grain
Journal Article
(2005)
Author(s)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
D Abe (External organisation)
S Inoue (External organisation)
T Shimoda (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/doi:10.1109/TED.2005.859689
To reference this document use:
https://resolver.tudelft.nl/uuid:1009ddfa-0e22-4f2f-9adb-e3df00241183
More Info
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Issue number
12
Volume number
52
Pages (from-to)
2622-2628
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