Dependence of single-crystalline Si TFT characteristics on the channel position inside a location-controlled grain

Journal Article (2005)
Author(s)

V Rana (TU Delft - Electronic Components, Technology and Materials)

R. Ishihara (TU Delft - Electronic Components, Technology and Materials)

Y Hiroshima (External organisation)

D Abe (External organisation)

S Inoue (External organisation)

T Shimoda (External organisation)

JW Metselaar (TU Delft - Electronic Components, Technology and Materials)

C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/doi:10.1109/TED.2005.859689
More Info
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Issue number
12
Volume number
52
Pages (from-to)
2622-2628

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