Integral impact of BTI and voltage temperature variation on SRAM sense amplifier
Conference Paper
(2015)
Author(s)
I. Agbo (TU Delft - Computer Engineering)
M Taouil (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
H Kukner (External organisation)
P. Weckx (External organisation)
Praveen Raghavan (External organisation)
F. Catthoor (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/VTS.2015.7116291
To reference this document use:
https://resolver.tudelft.nl/uuid:1ce579e5-9142-41bd-9272-58fc1a25544d
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Publication Year
2015
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
ISBN (print)
978-1-4799-7597-6
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