Electrical property of coincidence site lattice grain boundary in location-controlled Si island by excimer-laser crystallization

Journal Article (2005)
Author(s)

Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)

M He (TU Delft - Electronic Components, Technology and Materials)

V Rana (TU Delft - Electronic Components, Technology and Materials)

Y Hiroshima (External organisation)

S Inoue (External organisation)

T Shimoda (External organisation)

JW Metselaar (TU Delft - Electronic Components, Technology and Materials)

C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/doi:10.1016/j.tsf.2005.01.044
More Info
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Issue number
1-2
Volume number
487
Pages (from-to)
97-101

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