Analysis of Cu/low-k bond pad delamination by using a novel failure index

Conference Paper (2005)
Author(s)

MAJ van Gils (External organisation)

O van der Sluis (External organisation)

Guo Qi Z Zhang (TU Delft - Dynamics of Micro and Nano Systems)

JHJ Jansen (External organisation)

RMJ Voncken (External organisation)

Research Group
Dynamics of Micro and Nano Systems
More Info
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Publication Year
2005
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
190-196
ISBN (print)
0-7803-9062-8

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