Gate oxide induced switch-on undershoot current observed in thin-film transistors
Journal Article
(2005)
Author(s)
F Yan (External organisation)
P Migliorato (External organisation)
Y. Hong (External organisation)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R Ishihara (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
D Abe (External organisation)
S Inoue (External organisation)
T Shimoda (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/doi:10.1063/1.1954896
To reference this document use:
https://resolver.tudelft.nl/uuid:481bb8ab-a3de-4f42-ac94-68f4ff104a0c
More Info
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Issue number
25
Volume number
86
Pages (from-to)
1-3
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