Bias temperature instability analysis of FinFET based SRAM cells

Conference paper (2014)

Authors

M.S.K. Seyab Computer Engineering - EEMCS
I.O. Agbo Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
H Kukner External organisation
B Kaczer External organisation
P Raghavan External organisation
Francky Catthoor External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2014

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering