Bias temperature instability analysis of FinFET based SRAM cells
Conference Paper
(2014)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
I. Agbo (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
H Kukner (External organisation)
B Kaczer (External organisation)
P Raghavan (External organisation)
F. Catthoor (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.7873/DATE.2014.044
To reference this document use:
https://resolver.tudelft.nl/uuid:4ca44d98-344e-4e5b-b010-fdcf076d71ad
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Publication Year
2014
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
ISBN (print)
978-3-9815370-2-4
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