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B Kaczer
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2 records found
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Journal article -
H Kukner
,
F. Khan
,
Pieter Weckx
,
P Raghavan
,
S. Hamdioui
,
B Kaczer
,
Francky Catthoor
,
L van der Perre
,
R Lauwereins
,
G Groeseneken
Bias temperature instability analysis of FinFET based SRAM cells
Conference paper -
M.S.K. Seyab
,
I.O. Agbo
,
S. Hamdioui
,
H Kukner
,
B Kaczer
,
P Raghavan
,
Francky Catthoor