Outlook: From Physics of Failure to Physics of Degradation
Williem van Driel (TU Delft - Electronic Components, Technology and Materials)
Maryam Yazdan Yazdan Mehr (TU Delft - Electronic Components, Technology and Materials)
X.J. Fan (Lamar University)
Guo Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
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Abstract
In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts.