Dependence of single-crystalline Si TFT characteristics on the channel position in a location-controlled grain

V Rana (TU Delft - Electronic Components, Technology and Materials)

R. Ishihara (TU Delft - Electronic Components, Technology and Materials)

Y Hiroshima (External organisation)

D Abe (External organisation)

S Higashi (External organisation)

S Inoue (External organisation)

T Shimoda (External organisation)

JW Metselaar (TU Delft - Electronic Components, Technology and Materials)

C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)