Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process

D Danciu (TU Delft - Electronic Components, Technology and Materials)

R Ishihara (TU Delft - Electronic Components, Technology and Materials)

F.D. Tichelaar (QN/High Resolution Electron Microscopy)

Y Hiroshima (External organisation)

S Inoue (External organisation)

T Shimoda (External organisation)

JW Metselaar (TU Delft - Electronic Components, Technology and Materials)

Kees Beenakker (TU Delft - Electronic Components, Technology and Materials)