Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain
Conference Paper
(2004)
Author(s)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
D Abe (External organisation)
S Inoue (External organisation)
T Shimoda (External organisation)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:a069bc2d-e75b-432c-845c-cb54f8c7affa
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Publication Year
2004
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
ISBN (print)
0004-966X
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