A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

Conference Paper (2007)
Author(s)

M. Marchetti (TU Delft - Electronics)

K Buisman (Student TU Delft)

M.J. Pelk (TU Delft - Electronics)

Leo C. N. Vreede (TU Delft - Electronics)

Research Group
Electronics
DOI related publication
https://doi.org/10.1109/ARFTG.2007.8376175
More Info
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Publication Year
2007
Language
English
Research Group
Electronics
Pages (from-to)
33-36
ISBN (print)
978-1-5386-7296-9
ISBN (electronic)
978-1-5386-7295-2

Abstract

A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.

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