A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

Conference paper (2007)

Authors

M. Marchetti Electronics - EEMCS
K. Buisman Student
M.J. Pelk Electronics - EEMCS
L.C.N. de Vreede Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
Dynamic range Device characterization Isothermal Pulsed measurements
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Published Date

2007

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics

Abstract

A low-cost, highly versatile, pulsed RF - pulsed I-V isothermal device characterization setup is presented. The realized setup combines a synthetic instrument high dynamic range pulsed network analyzer with pulsed I-V measurements. The resulting configuration facilitates very accurate characterization of low-power as well as high-power devices over a wide range of bias and pulse conditions. The achieved system accuracy is reported, and its measurement capabilities are highlighted through the characterization of self-heating effects in LDMOS devices and silicon-on-glass VDMOS.