Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier
Conference Paper
(2015)
Author(s)
I. Agbo (TU Delft - Computer Engineering)
M Taouil (TU Delft - Computer Engineering)
S. Hamdioui (TU Delft - Computer Engineering)
Stefan Cosemans (External organisation)
P. Weckx (External organisation)
P Raghavan (External organisation)
F. Catthoor (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/DTIS.2015.7127371
To reference this document use:
https://resolver.tudelft.nl/uuid:c079957e-89d7-4c5e-8abe-645c3c652f74
More Info
expand_more
expand_more
Publication Year
2015
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
ISBN (print)
978-1-4799-1999-4
No files available
Metadata only record. There are no files for this record.