Impact of partial resistive defects and bias temperature instability on SRAM decoder reliablity
Conference Paper
(2012)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
Mottaqiallah Taouil (TU Delft - Computer Engineering)
H Kukner (External organisation)
Praveen Raghavan (External organisation)
Francky Catthoor (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:c3b0e770-3a82-4186-8355-15bece49df62
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
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