Impact of partial resistive defects and bias temperature instability on SRAM decoder reliablity

Conference paper (2012)

Authors

M.S.K. Seyab Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
M. Taouil Computer Engineering - EEMCS
H Kukner External organisation
P Raghavan External organisation
Francky Catthoor External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
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Published Date

2012

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering